| TFFM40 | Analytical Methods in Materials Science, 6 ECTS credits. /Materialtekniska analysmetoder/ |
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Prel. scheduled
hours: 86 |
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Area of Education: Science Subject area: Physics |
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| Advancement level
(G1, G2, A): A
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| Aim: The objective with the course is to give an in depth knowledge about the principles for modern measurement techniques and to operate advanced instrumentation that is being used in materials science today. The emphasis is directed towards techniques that are used both in industrial and university research and development laboratories. It provides knowledge for a position as a research director in industry or academia. |
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| Prerequisites: (valid for students admitted to programmes within which the course is offered) TFFY70 Physics of Condensed Matter and it is desired that the course TFFM08 Physics Laboratory Work II have been taken. Note: Admission requirements for non-programme students usually also include admission requirements for the programme and threshhold requirements for progression within the programme, or corresponding. |
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| Supplementary courses: Graduate courses in Electron microscopy and Crystallography and diffraction at IFM. |
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| Organisation: Lectures: totally 14 hours divided into 8 lectures. Laborations: totally 72 hours including 9 full day laborations. The course is on-going throughout the first semester. |
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| Course contents: The lectures covers the basic physical mechanisms of the interaction between solid matter and electromagnetic radiation, electrons and ions. Also fundamental aspects of diffraction and contrast theory are being covered. In addition the principles and usage of microprobes, electron spectroscopy techniques (AES and XPS), x-ray diffraction, electron microscopy (SEM and TEM), light optical microscopy, Atomic Force Microscopy (AFM) and ellipsometry are described. The course consists of 9 laborations covering the following techniques; Light Optical Microscopy, Ellipsometry, Scanning Electron Microscopy, Transmission Electron Microscopy, Electron Diffraction, X-ray Diffraction, Auger Electron Spectroscopy (AES), X-ray Photo Electron Spectroscopy (XPS), and Microprobe Analyses. |
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| Course literature: PEJ Flewitt and RK Wild: Physical Methods for Materials Characterization. Laborations-PM. Your notes from the lectures. Laboration PM - Your notes from the lectures. |
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| Examination: | ||||
| A written examination.(U,3,4,5) Completion of all laborations. (U,G) |
1 p 3 p |
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1,5 ECTS 4,5 ECTS |
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Course language is English. Department offering the course: IFM. Director of Studies: Leif Johansson Examiner: Hans Högberg Link to the course homepage at the department Course Syllabus in Swedish |
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