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| TFFM40 | Analytical Methods in Materials Science, 4 p (sw) /Materialtekniska analysmetoder/ Advancement level: C | |
| Aim: The objective with the course is to increase the knowledge about modern measurement techniques and about advanced instrumentation that is being used in materials science today. The emphasis is on techniques that are used both in industrial and university research and development laboratories.Prerequisites: TFFY70 Physics of Condensed Matter and it is desired that the course TFFM07 Physics Laboratory Work II have been taken.Supplementary courses: Graduate courses in Electron microscopy and Crystallography and diffraction at IFM.Course content: The lectures covers the basic physical mechanisms of the interaction between solid matter and electromagnetic radiation, electrons and ions. Also fundamental aspects of diffraction and contrast theory are being covered. In addition the principles and usage of microprobes, electron spectroscopy techniques (AES and ESCA), x-ray diffraction, electron microscopy (SEM and TEM), light microscopy, and ellipsometry are described. The course consists of 9 laborations covering the following techniques; Light Microscopy, Ellipsometry, Scanning Electron Microscopy, Transmission Electron Microscopy, Electron Diffraction, X-ray Diffraction, Auger Electron Spectroscopy, X-ray Photo Electron Spectroscopy, and Microprobe Analyses. An optional study visit to an advanced materials research laboratory is included.Course literature: PEJ Flewitt and RK Wild: Physical Methods for Materials Characterization. Laborations-PM. Notes from lectures. | ||
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