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Linköping Institute of Technology

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Valid for year : 2002
 
NFYD81 Methods for Analysis of Materials and Surfaces, 7,5 ECTS credits.
/Material- och ytanalytiska metoder/

For:   Fys  

  Area of Education:

Subject area:

  Advancement level (A-D): D

Aim:
This course gives basic knowledge in physical measurement methods and advanced analytical methods with emphasis on materials and surface analysis. The course is directed towards standard methods and instruments of the kind you may find in a well equipped laboratory in the industry or a research institute.

Prerequisites: (valid for students admitted to programmes within which the course is offered)
Passed NFYC57 Physical Projects

Note: Admission requirements for non-programme students usually also include admission requirements for the programme and threshhold requirements for progression within the programme, or corresponding.

Organisation:
The theoretical part of the course is given mainly in lectures, but also partly as seminars. The laboratory work (8 different laboratory exercises) is a large and important part of the course.

Course contents:
Theory: Orientation about materials and surface science. Fundamental and technical problems concerning measurements and analysis. Theory of important analytical methods such as X-ray diffraction, electron microscopy (TEM, SEM), force- and tunneling microscopy (AFM, SFM, STM), mass spectrometry, ellipsometry, surface sensitive electron spectroscopies (ESCA, AES, FTIR) etc. Orientation about current research. Laborations: X-ray diffraction, TEM, SEM, AES, ESCA, Ellipsometry, STM, FTIR.

Course literature:
Printed lecture notes, laboration notes, review articles.

Examination:
A written examination
Active participation in all laboratory exercises with an extensive written laboration report
3 p
2 p
 



Course language is .
Department offering the course: IFM.
Director of Studies: Magnus Boman
Examiner: Lars Wilzén
Link to the course homepage at the department


Course Syllabus in Swedish

Linköping Institute of Technology

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Contact: TFK , val@tfk.liu.se
Last updated: 01/22/2003